Items where Author is "Toumi, S."
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Toumi, S. (2023) Investigation of the Inhomogeneity Phenomenon in the Metal/Semiconductor Interface: Mo/n-type-4H-SiC Schottky Diode. In: Fundamental Research and Application of Physical Science Vol. 6. B P International, pp. 122-142. ISBN 978-81-19217-84-7