Items where Author is "Mbamara, U. S."

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Mbamara, U. S. (2023) XRD, XPS and Dynamic SIMS Analyses of p-Type Zinc Oxynitride Thin Films Deposited on Silicon Wafers by MOCVD. In: Fundamental Research and Application of Physical Science Vol. 6. B P International, pp. 58-69. ISBN 978-81-19217-84-7

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